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A. G. O'Neill

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2003
2EEA. B. Horsfall, J. M. M. dos Santos, S. M. Soare, N. G. Wright, A. G. O'Neill, S. J. Bull, A. J. Walton, A. M. Gundlach, J. T. M. Stevenson: Direct measurement of residual stress in integrated circuit interconnect features. Microelectronics Reliability 43(9-11): 1797-1801 (2003)
2001
1EEKostis Michelakis, S. Despotopoulos, S. G. Badcock, Christos Papavassiliou, A. G. O'Neill, Chris Toumazou: SiGe HMOSFET differential pair. ISCAS (1) 2001: 679-682

Coauthor Index

1S. G. Badcock [1]
2S. J. Bull [2]
3S. Despotopoulos [1]
4A. M. Gundlach [2]
5A. B. Horsfall [2]
6Kostis Michelakis [1]
7Christos Papavassiliou [1]
8J. M. M. dos Santos [2]
9S. M. Soare [2]
10J. T. M. Stevenson [2]
11Christofer Toumazou (Chris Toumazou) [1]
12A. J. Walton [2]
13N. G. Wright [2]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)