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2005 | ||
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1 | EE | James Prendergast, Eoin O'Driscoll, Ed Mullen: Investigation into the correct statistical distribution for oxide breakdown over oxide thickness range. Microelectronics Reliability 45(5-6): 973-977 (2005) |
1 | Ed Mullen | [1] |
2 | James Prendergast | [1] |