Ed Mullen

List of publications from the DBLP Bibliography Server - FAQ

2005

1 EE James Prendergast, Eoin O'Driscoll, Ed Mullen: Investigation into the correct statistical distribution for oxide breakdown over oxide thickness range. Microelectronics Reliability 45(5-6): 973-977 (2005)

2005
1	EE	James Prendergast, Eoin O'Driscoll, Ed Mullen: Investigation into the correct statistical distribution for oxide breakdown over oxide thickness range. Microelectronics Reliability 45(5-6): 973-977 (2005)

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