H. Nielen
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2006
1
EE
T. Pompl
,
C. Schlünder
,
M. Hommel
, H. Nielen,
J. Schneider
: Practical aspects of reliability analysis for IC designs.
DAC 2006
: 193-198
Coauthor
Index
1
M. Hommel
[
1
]
2
T. Pompl
[
1
]
3
C. Schlünder
[
1
]
4
J. Schneider
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)