R. Nicoletti

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2002

1 EE M. Catelani, R. Nicoletti: A Custom-designed automatic measurement system for acquisition and management of reliability data. Microelectronics Reliability 42(9-11): 1381-1384 (2002)

2002
1	EE	M. Catelani, R. Nicoletti: A Custom-designed automatic measurement system for acquisition and management of reliability data. Microelectronics Reliability 42(9-11): 1381-1384 (2002)

Coauthor Index

1 M. Catelani [1]