| |
| 2002 | ||
|---|---|---|
| 3 | EE | M. Mugnaini, M. Catelani, G. Ceschini, A. Masi, F. Nocentini: Pseudo Time-Variant parameters in centrifugal compressor availability studies by means of Markov models. Microelectronics Reliability 42(9-11): 1373-1376 (2002) |
| 2 | EE | M. Catelani, R. Nicoletti: A Custom-designed automatic measurement system for acquisition and management of reliability data. Microelectronics Reliability 42(9-11): 1381-1384 (2002) |
| 1 | EE | P. Battista, M. Catelani, G. Fasano, A. Materassi: On the reliability of instruments for environmental monitoring: some practical considerations. Microelectronics Reliability 42(9-11): 1393-1396 (2002) |
| 1 | P. Battista | [1] |
| 2 | G. Ceschini | [3] |
| 3 | G. Fasano | [1] |
| 4 | A. Masi | [3] |
| 5 | A. Materassi | [1] |
| 6 | M. Mugnaini | [3] |
| 7 | R. Nicoletti | [2] |
| 8 | F. Nocentini | [3] |