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R. Nickson

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2005
1EES. A. Rushworth, L. M. Smith, A. J. Kingsley, R. Odedra, R. Nickson, P. Hughes: Vapour pressure measurement of low volatility precursors. Microelectronics Reliability 45(5-6): 1000-1002 (2005)

Coauthor Index

1P. Hughes [1]
2A. J. Kingsley [1]
3R. Odedra [1]
4S. A. Rushworth [1]
5L. M. Smith [1]

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