| |
| 2008 | ||
|---|---|---|
| 2 | EE | Toshio Nakamura, Takeo Igarashi: An application-independent system for visualizing user operation history. UIST 2008: 23-32 |
| 2004 | ||
| 1 | EE | Yu Gu, Toshio Nakamura: Interfacial delamination and fatigue life estimation of 3D solder bumps in flip-chip packages. Microelectronics Reliability 44(3): 471-483 (2004) |
| 1 | Yu Gu | [1] |
| 2 | Takeo Igarashi | [2] |