2006 | ||
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1 | EE | Yasue Yamamoto, Takeshi Hidaka, Hiroki Nakamura, Hiroshi Sakuraba, Fujio Masuoka: Decananometer Surrounding Gate Transistor (SGT) Scalability by Using an Intrinsically-Doped Body and Gate Work Function Engineering. IEICE Transactions 89-C(4): 560-567 (2006) |
1 | Takeshi Hidaka | [1] |
2 | Fujio Masuoka | [1] |
3 | Hiroshi Sakuraba | [1] |
4 | Yasue Yamamoto | [1] |