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Cynthia F. Murphy

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1997
1EECynthia F. Murphy, Magdy S. Abadir, Peter Sandborn: Economic Analysis of Test Process Flows for Multichip Modules Using Known Good Die. J. Electronic Testing 10(1-2): 151-166 (1997)

Coauthor Index

1Magdy S. Abadir [1]
2Peter Sandborn [1]

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