Cynthia F. Murphy
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1997
1
EE
Cynthia F. Murphy,
Magdy S. Abadir
,
Peter Sandborn
: Economic Analysis of Test Process Flows for Multichip Modules Using Known Good Die.
J. Electronic Testing 10
(1-2): 151-166 (1997)
Coauthor
Index
1
Magdy S. Abadir
[
1
]
2
Peter Sandborn
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)