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2002 | ||
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1 | EE | Nobuyuki Sano, Kazuya Matsuzawa, Mikio Mukai, Noriaki Nakayama: On discrete random dopant modeling in drift-diffusion simulations: physical meaning of 'atomistic' dopants. Microelectronics Reliability 42(2): 189-199 (2002) |
1 | Kazuya Matsuzawa | [1] |
2 | Noriaki Nakayama | [1] |
3 | Nobuyuki Sano | [1] |