| |
| 2002 | ||
|---|---|---|
| 1 | EE | Nobuyuki Sano, Kazuya Matsuzawa, Mikio Mukai, Noriaki Nakayama: On discrete random dopant modeling in drift-diffusion simulations: physical meaning of 'atomistic' dopants. Microelectronics Reliability 42(2): 189-199 (2002) |
| 1 | Kazuya Matsuzawa | [1] |
| 2 | Noriaki Nakayama | [1] |
| 3 | Nobuyuki Sano | [1] |