| |
| 2002 | ||
|---|---|---|
| 2 | EE | A. Muehlhoff: Inversion of degradation direction of n-channel MOS-FETs in off-state operation. Microelectronics Reliability 42(9-11): 1453-1456 (2002) |
| 2001 | ||
| 1 | A. Muehlhoff: An Extrapolation Model for Lifetime Prediction for Off-State - Degradation of MOS-FETs. Microelectronics Reliability 41(9-10): 1289-1293 (2001) | |