| |
| 2005 | ||
|---|---|---|
| 1 | EE | C. M. Garner, G. Kloster, G. Atwood, L. Mosley, A. C. Palanduz: Challenges for dielectric materials in future integrated circuit technologies. Microelectronics Reliability 45(5-6): 919-924 (2005) |
| 1 | G. Atwood | [1] |
| 2 | C. M. Garner | [1] |
| 3 | G. Kloster | [1] |
| 4 | A. C. Palanduz | [1] |