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C. M. Garner

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2005
1EEC. M. Garner, G. Kloster, G. Atwood, L. Mosley, A. C. Palanduz: Challenges for dielectric materials in future integrated circuit technologies. Microelectronics Reliability 45(5-6): 919-924 (2005)

Coauthor Index

1G. Atwood [1]
2G. Kloster [1]
3L. Mosley [1]
4A. C. Palanduz [1]

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