F. Mondon
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2003
1
EE
F. Mondon,
S. Blonkowski
: Electrical characterisation and reliability of HfO
2
and Al
2
O
3
-HfO
2
MIM capacitors.
Microelectronics Reliability 43
(8): 1259-1266 (2003)
Coauthor
Index
1
S. Blonkowski
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
