Junichi Mitani

2002
1	EE	Yoshihiro Takao, Hiroshi Kudo, Junichi Mitani, Yoshiyuki Kotani, Satoshi Yamaguchi, Keizaburo Yoshie, Kazuo Sukegawa, Nobuhisa Naori, Satoru Asai, Michiari Kawano: A 0.11 mum CMOS technology featuring copper and very low k interconnects with high performance and reliability. Microelectronics Reliability 42(1): 15-25 (2002)

Coauthor Index

1	Satoru Asai	[1]
2	Michiari Kawano	[1]
3	Yoshiyuki Kotani	[1]
4	Hiroshi Kudo	[1]
5	Nobuhisa Naori	[1]
6	Kazuo Sukegawa	[1]
7	Yoshihiro Takao	[1]
8	Satoshi Yamaguchi	[1]
9	Keizaburo Yoshie	[1]