2004 | ||
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2 | EE | Purushothaman Srinivasan, B. Vootukuru, Durga Misra: Screening of Hot Electron Effect During Plasma Processing. VLSI Design 2004: 291- |
2001 | ||
1 | EE | R. K. Jarwal, Durga Misra: Degradation Of Nmosfets During High-Field Injection With Reverse Biased Voltage At Source And Drain Junctions. VLSI Design 2001: 485-490 |
1 | R. K. Jarwal | [1] |
2 | Purushothaman Srinivasan | [2] |
3 | B. Vootukuru | [2] |