P. Min

2006
1	EE	P. Min, H. Yi, J. Song, S. Baeg, S. Park: Efficient Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. on CAD of Integrated Circuits and Systems 25(11): 2605-2608 (2006)

Coauthor Index

1	S. Baeg	[1]
2	S. Park	[1]
3	J. Song	[1]
4	H. Yi	[1]