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P. Min

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2006
1EEP. Min, H. Yi, J. Song, S. Baeg, S. Park: Efficient Interconnect Test Patterns for Crosstalk and Static Faults. IEEE Trans. on CAD of Integrated Circuits and Systems 25(11): 2605-2608 (2006)

Coauthor Index

1S. Baeg [1]
2S. Park [1]
3J. Song [1]
4H. Yi [1]

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