| 2006 |
|---|
| 3 | EE | P. Min,
H. Yi,
J. Song,
S. Baeg,
S. Park:
Efficient Interconnect Test Patterns for Crosstalk and Static Faults.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(11): 2605-2608 (2006) |
| 2000 |
|---|
| 2 | EE | S. Baeg,
Nasser D. Kehtarnavaz:
Texture Based Classification of Mass Abnormalities in Mammograms.
CBMS 2000: 163-168 |
| 1998 |
|---|
| 1 | EE | S. Baeg,
A. T. Popov,
V. G. Kamat,
Sinan Batman,
Krishnamoorthy Sivakumar,
Nasser D. Kehtarnavaz,
Edward R. Dougherty,
R. B. Shah:
Segmentation of Mammograms into Distinct Morphological Texture Regions.
CBMS 1998: 20-25 |
