Steven R. Miller

List of publications from the DBLP Bibliography Server - FAQ

1993

1 EE Benjamin R. Epstein, Martin H. Czigler, Steven R. Miller: Fault detection and classification in linear integrated circuits: an application of discrimination analysis and hypothesis testing. IEEE Trans. on CAD of Integrated Circuits and Systems 12(1): 102-113 (1993)

1993
1	EE	Benjamin R. Epstein, Martin H. Czigler, Steven R. Miller: Fault detection and classification in linear integrated circuits: an application of discrimination analysis and hypothesis testing. IEEE Trans. on CAD of Integrated Circuits and Systems 12(1): 102-113 (1993)

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