| |
| 1993 | ||
|---|---|---|
| 2 | EE | Benjamin R. Epstein, Martin H. Czigler, Steven R. Miller: Fault detection and classification in linear integrated circuits: an application of discrimination analysis and hypothesis testing. IEEE Trans. on CAD of Integrated Circuits and Systems 12(1): 102-113 (1993) |
| 1992 | ||
| 1 | Benjamin R. Epstein, Rajesh Hingorani, J. M. Shapiro, Martin H. Czigler: Multispectral KLT-Wavelet Data Compression for Landsat Thematic Mapper Images. Data Compression Conference 1992: 200-208 | |
| 1 | Martin H. Czigler | [1] [2] |
| 2 | Rajesh Hingorani | [1] |
| 3 | Steven R. Miller | [2] |
| 4 | J. M. Shapiro | [1] |