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1993 | ||
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2 | EE | Benjamin R. Epstein, Martin H. Czigler, Steven R. Miller: Fault detection and classification in linear integrated circuits: an application of discrimination analysis and hypothesis testing. IEEE Trans. on CAD of Integrated Circuits and Systems 12(1): 102-113 (1993) |
1992 | ||
1 | Benjamin R. Epstein, Rajesh Hingorani, J. M. Shapiro, Martin H. Czigler: Multispectral KLT-Wavelet Data Compression for Landsat Thematic Mapper Images. Data Compression Conference 1992: 200-208 |
1 | Benjamin R. Epstein | [1] [2] |
2 | Rajesh Hingorani | [1] |
3 | Steven R. Miller | [2] |
4 | J. M. Shapiro | [1] |