B. Meslet

2002
1	EE	B. Foucher, J. Boullié, B. Meslet, D. Das: A review of reliability prediction methods for electronic devices. Microelectronics Reliability 42(8): 1155-1162 (2002)

Coauthor Index

1	J. Boullié	[1]
2	D. Das	[1]
3	B. Foucher	[1]