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2003 | ||
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2 | EE | A. Cazarré, F. Lépinois, A. Marty, S. Pinel, J. Tasselli, J. P. Bailbé, J. R. Morante, F. Murray: Electrical qualification of new ultrathin integration techniques. Microelectronics Reliability 43(1): 111-115 (2003) |
1 | EE | Sylvaine Muratet, Jean-Yves Fourniols, G. Soto-Romero, Aitor Endemaño Isasi, A. Marty, Marc P. Y. Desmulliez: MEMS reliability modelling methodology: application to wobble micromotor failure analysis. Microelectronics Reliability 43(9-11): 1945-1949 (2003) |
1 | J. P. Bailbé | [2] |
2 | A. Cazarré | [2] |
3 | Marc P. Y. Desmulliez | [1] |
4 | Jean-Yves Fourniols | [1] |
5 | Aitor Endemaño Isasi | [1] |
6 | F. Lépinois | [2] |
7 | J. R. Morante | [2] |
8 | Sylvaine Muratet | [1] |
9 | F. Murray | [2] |
10 | S. Pinel | [2] |
11 | G. Soto-Romero | [1] |
12 | J. Tasselli | [2] |