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| 2003 | ||
|---|---|---|
| 1 | EE | A. Cazarré, F. Lépinois, A. Marty, S. Pinel, J. Tasselli, J. P. Bailbé, J. R. Morante, F. Murray: Electrical qualification of new ultrathin integration techniques. Microelectronics Reliability 43(1): 111-115 (2003) |
| 1 | J. P. Bailbé | [1] |
| 2 | A. Cazarré | [1] |
| 3 | A. Marty | [1] |
| 4 | J. R. Morante | [1] |
| 5 | F. Murray | [1] |
| 6 | S. Pinel | [1] |
| 7 | J. Tasselli | [1] |