2005 | ||
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1 | EE | J. Y. Liao, G. L. Woods, X. Chen, H. L. Marks: Localization of Marginal Circuits for Yield Diagnostics Utilizing a Dynamic Laser Stimulation Probing System. Microelectronics Reliability 45(9-11): 1554-1557 (2005) |
1 | X. Chen | [1] |
2 | J. Y. Liao | [1] |
3 | G. L. Woods | [1] |