J. Y. Liao

2005
1	EE	J. Y. Liao, G. L. Woods, X. Chen, H. L. Marks: Localization of Marginal Circuits for Yield Diagnostics Utilizing a Dynamic Laser Stimulation Probing System. Microelectronics Reliability 45(9-11): 1554-1557 (2005)

Coauthor Index

1	X. Chen	[1]
2	H. L. Marks	[1]
3	G. L. Woods	[1]