| 2007 |
|---|
| 12 | EE | Soumen Maity,
Amiya Nayak,
S. Ramsundar:
Characterization, testing and reconfiguration of faults in mesh networks.
Integration 40(4): 525-535 (2007) |
| 2006 |
|---|
| 11 | EE | Soumen Maity,
S. Ramsundar:
On Reliability Analysis of Forward Loop Forward Hop Networks.
ICDCIT 2006: 136-144 |
| 10 | EE | Soumen Maity,
Amiya Nayak,
S. Ramsundar:
On Fault Tolerance of Two-Dimensional Mesh Networks.
ICDCN 2006: 442-453 |
| 9 | EE | Soumen Maity,
Chrisil Arackaparambil,
Kezhasono Meyase:
Construction of 1-Resilient Boolean Functions with Very Good Nonlinearity.
SETA 2006: 417-431 |
| 2005 |
|---|
| 8 | EE | Soumen Maity,
Amiya Nayak:
Improved Test Generation Algorithms for Pair-Wise Testing.
ISSRE 2005: 235-244 |
| 2004 |
|---|
| 7 | EE | Soumen Maity,
Subhamoy Maitra:
Minimum Distance between Bent and 1-Resilient Boolean Functions.
FSE 2004: 143-160 |
| 6 | EE | Soumen Maity,
Amiya Nayak,
Bimal K. Roy:
Reliability of VLSI Linear Arrays with Redundant Links.
IWDC 2004: 326-337 |
| 5 | EE | Soumen Maity,
Amiya Nayak,
Bimal K. Roy:
Characterization of catastrophic faults in two-dimensional reconfigurable systolic arrays with unidirectional links.
Inf. Process. Lett. 92(4): 189-197 (2004) |
| 4 | EE | Soumen Maity,
Amiya Nayak,
Bimal K. Roy:
On characterization of catastrophic faults in two-dimensional VLSI arrays.
Integration 38(2): 267-281 (2004) |
| 2002 |
|---|
| 3 | EE | Soumen Maity,
Thomas Johansson:
Construction of Cryptographically Important Boolean Functions.
INDOCRYPT 2002: 234-245 |
| 2 | EE | Soumen Maity,
Bimal K. Roy,
Amiya Nayak:
On enumeration of catastrophic fault patterns.
Inf. Process. Lett. 81(4): 209-212 (2002) |
| 2001 |
|---|
| 1 | EE | Soumen Maity,
Bimal K. Roy,
Amiya Nayak:
Enumerating catastrophic fault patterns in VLSI arrays with both uni- and bidirectional links.
Integration 30(2): 157-168 (2001) |
