Xinnan Lin

2009
1	EE	Chenyue Ma, Bo Li, Lining Zhang, Jin He, Xing Zhang, Xinnan Lin, Mansun Chan: A unified FinFET reliability model including high K gate stack dynamic threshold voltage, hot carrier injection, and negative bias temperature instability. ISQED 2009: 7-12

Coauthor Index

1	Mansun Chan	[1]
2	Jin He	[1]
3	Bo Li	[1]
4	Chenyue Ma	[1]
5	Lining Zhang	[1]
6	Xing Zhang	[1]