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Xinnan Lin

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2009
1EEChenyue Ma, Bo Li, Lining Zhang, Jin He, Xing Zhang, Xinnan Lin, Mansun Chan: A unified FinFET reliability model including high K gate stack dynamic threshold voltage, hot carrier injection, and negative bias temperature instability. ISQED 2009: 7-12

Coauthor Index

1Mansun Chan [1]
2Jin He [1]
3Bo Li [1]
4Chenyue Ma [1]
5Lining Zhang [1]
6Xing Zhang [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)