2009 | ||
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1 | EE | Chenyue Ma, Bo Li, Lining Zhang, Jin He, Xing Zhang, Xinnan Lin, Mansun Chan: A unified FinFET reliability model including high K gate stack dynamic threshold voltage, hot carrier injection, and negative bias temperature instability. ISQED 2009: 7-12 |
1 | Mansun Chan | [1] |
2 | Jin He | [1] |
3 | Bo Li | [1] |
4 | Chenyue Ma | [1] |
5 | Lining Zhang | [1] |
6 | Xing Zhang | [1] |