Henry Y. Lu
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2006
1
EE
Henry Y. Lu,
Haluk Balkan
,
K. Y. Simon Ng
: Microstructure evolution of the Sn-Ag-y%Cu interconnect.
Microelectronics Reliability 46
(7): 1058-1070 (2006)
Coauthor
Index
1
Haluk Balkan
[
1
]
2
K. Y. Simon Ng
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
