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Haluk Balkan

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2006
1EEHenry Y. Lu, Haluk Balkan, K. Y. Simon Ng: Microstructure evolution of the Sn-Ag-y%Cu interconnect. Microelectronics Reliability 46(7): 1058-1070 (2006)

Coauthor Index

1Henry Y. Lu [1]
2K. Y. Simon Ng [1]

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