Feiyin Lu
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2005
1
EE
Yanzhuo Tan
,
Yinhe Han
,
Xiaowei Li
, Feiyin Lu,
Yuchuan Chen
: Validation analysis and test flow optimization of VLSI chip.
ISCAS (6) 2005
: 5666-5669
Coauthor
Index
1
Yuchuan Chen
[
1
]
2
Yinhe Han
[
1
]
3
Xiaowei Li
[
1
]
4
Yanzhuo Tan
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)