| |
| 2008 | ||
|---|---|---|
| 2 | EE | Lushan Liu, Pradeep Nagaraj, Shambhu Upadhyaya, Ramalingam Sridhar: Defect Analysis and Defect Tolerant Design of Multi-port SRAMs. J. Electronic Testing 24(1-3): 165-179 (2008) |
| 2006 | ||
| 1 | EE | Lushan Liu, Ramalingam Sridhar, Shambhu J. Upadhyaya: A 3-port Register File Design for Improved Fault Tolerance on Resistive Defects in Core-Cells. DFT 2006: 545-553 |
| 1 | Pradeep Nagaraj | [2] |
| 2 | Ramalingam Sridhar | [1] [2] |
| 3 | Shambhu Upadhyaya | [2] |
| 4 | Shambhu J. Upadhyaya | [1] |