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J. J. Liou

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2007
1EEY. Fu, H. Wong, J. J. Liou: Characterization and modeling of flicker noise in junction field-effect transistor with source and drain trench isolation. Microelectronics Reliability 47(1): 46-50 (2007)

Coauthor Index

1Y. Fu [1]
2H. Wong [1]

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