J. J. Liou
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2007
1
EE
Y. Fu
,
H. Wong
, J. J. Liou: Characterization and modeling of flicker noise in junction field-effect transistor with source and drain trench isolation.
Microelectronics Reliability 47
(1): 46-50 (2007)
Coauthor
Index
1
Y. Fu
[
1
]
2
H. Wong
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)