J. Linn

2003
3	EE	C.-T. Wu, A. Mieckowski, R. S. Ridley, G. Dolny, T. Grebs, J. Linn, J. Ruzyllo: Effect of nitridation on the reliability of thick gate oxides. Microelectronics Reliability 43(1): 43-47 (2003)
1992
2		Morrie Gasser, Charles Kaufman, J. Linn, Y. Le Roux, Joseph Tardo: DASS: Distributed Authentication Security Service. IFIP Congress (2) 1992: 447-456
1990
1		J. Linn: Practical Authentication for Distributed Computing. IEEE Symposium on Security and Privacy 1990: 31-40

Coauthor Index

1	G. Dolny	[3]
2	Morrie Gasser	[2]
3	T. Grebs	[3]
4	Charles Kaufman	[2]
5	A. Mieckowski	[3]
6	R. S. Ridley	[3]
7	Y. Le Roux	[2]
8	J. Ruzyllo	[3]
9	Joseph Tardo	[2]
10	C.-T. Wu	[3]

Colors in the list of coauthors