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J. Linn

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2003
3EEC.-T. Wu, A. Mieckowski, R. S. Ridley, G. Dolny, T. Grebs, J. Linn, J. Ruzyllo: Effect of nitridation on the reliability of thick gate oxides. Microelectronics Reliability 43(1): 43-47 (2003)
1992
2 Morrie Gasser, Charles Kaufman, J. Linn, Y. Le Roux, Joseph Tardo: DASS: Distributed Authentication Security Service. IFIP Congress (2) 1992: 447-456
1990
1 J. Linn: Practical Authentication for Distributed Computing. IEEE Symposium on Security and Privacy 1990: 31-40

Coauthor Index

1G. Dolny [3]
2Morrie Gasser [2]
3T. Grebs [3]
4Charles Kaufman [2]
5A. Mieckowski [3]
6R. S. Ridley [3]
7Y. Le Roux [2]
8J. Ruzyllo [3]
9Joseph Tardo [2]
10C.-T. Wu [3]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)