| |
| 2007 | ||
|---|---|---|
| 1 | EE | You-Lin Wu, Shi-Tin Lin, Tsung-Min Chang, Juin J. Liou: Reliability study of ultrathin oxide films subject to irradiation-then-stress treatment using conductive atomic force microscopy. Microelectronics Reliability 47(2-3): 419-421 (2007) |
| 1 | Tsung-Min Chang | [1] |
| 2 | Juin J. Liou | [1] |
| 3 | You-Lin Wu | [1] |