P. C. Lin

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2002

1 EE P. C. Lin, W. L. Pearn: Testing process capability for one-sided specification limit with application to the voltage level translator. Microelectronics Reliability 42(12): 1975-1983 (2002)

2002
1	EE	P. C. Lin, W. L. Pearn: Testing process capability for one-sided specification limit with application to the voltage level translator. Microelectronics Reliability 42(12): 1975-1983 (2002)

Coauthor Index

1 W. L. Pearn [1]