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Kao-Cheng Lin

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2007
1EEJyi-Tsong Lin, Yi-Chuen Eng, Tai-Yi Lee, Kao-Cheng Lin: Analysis of Si-body thickness variation for a new 40 nm gate length bFDSOI. VLSI Design 2007: 653-656

Coauthor Index

1Yi-Chuen Eng [1]
2Tai-Yi Lee [1]
3Jyi-Tsong Lin [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)