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Yi-Chuen Eng

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2008
2EEJyi-Tsong Lin, Yi-Chuen Eng: Analysis of Block Oxide Height Variations for a 40nm Gate Length bFDSOI-FET. JCP 3(5): 41-45 (2008)
2007
1EEJyi-Tsong Lin, Yi-Chuen Eng, Tai-Yi Lee, Kao-Cheng Lin: Analysis of Si-body thickness variation for a new 40 nm gate length bFDSOI. VLSI Design 2007: 653-656

Coauthor Index

1Tai-Yi Lee [1]
2Jyi-Tsong Lin [1] [2]
3Kao-Cheng Lin [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)