2008 | ||
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2 | EE | Jyi-Tsong Lin, Yi-Chuen Eng: Analysis of Block Oxide Height Variations for a 40nm Gate Length bFDSOI-FET. JCP 3(5): 41-45 (2008) |
2007 | ||
1 | EE | Jyi-Tsong Lin, Yi-Chuen Eng, Tai-Yi Lee, Kao-Cheng Lin: Analysis of Si-body thickness variation for a new 40 nm gate length bFDSOI. VLSI Design 2007: 653-656 |
1 | Tai-Yi Lee | [1] |
2 | Jyi-Tsong Lin | [1] [2] |
3 | Kao-Cheng Lin | [1] |