Tai-Yi Lee
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2007
1
EE
Jyi-Tsong Lin
,
Yi-Chuen Eng
, Tai-Yi Lee,
Kao-Cheng Lin
: Analysis of Si-body thickness variation for a new 40 nm gate length bFDSOI.
VLSI Design 2007
: 653-656
Coauthor
Index
1
Yi-Chuen Eng
[
1
]
2
Jyi-Tsong Lin
[
1
]
3
Kao-Cheng Lin
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)