G. H. Lin

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2003

1 EE W. L. Pearn, G. H. Lin: A reliable procedure for testing linear regulators with one-sided specification limits based on multiple samples. Microelectronics Reliability 43(4): 651-664 (2003)

2003
1	EE	W. L. Pearn, G. H. Lin: A reliable procedure for testing linear regulators with one-sided specification limits based on multiple samples. Microelectronics Reliability 43(4): 651-664 (2003)

Coauthor Index

1 W. L. Pearn [1]