| |
| 2007 | ||
|---|---|---|
| 2 | EE | Doohyung Lee, Chihoon Lee, Jahwan Koo, Jin-Wook Chung: Correlation Analysis of Available Bandwidth Estimators for Mobile HCI. HCI (8) 2007: 687-696 |
| 2003 | ||
| 1 | EE | Chihoon Lee, Donggun Park, Hyeong Joon Kim, Wonshik Lee: Electrical reliability of highly reliable 256M-bit mobile DRAM with top-edge round STI and dual gate oxide. Microelectronics Reliability 43(5): 735-739 (2003) |
| 1 | Jin-Wook Chung | [2] |
| 2 | Hyeong Joon Kim | [1] |
| 3 | Jahwan Koo | [2] |
| 4 | Doohyung Lee | [2] |
| 5 | Wonshik Lee | [1] |
| 6 | Donggun Park | [1] |