A. H. I. Lee

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2007

2 EE A. H. I. Lee, S. H. Chung, C. Y. Huang: Minimizing the Total Completion Time for the TFT-Array Factory Scheduling Problem (TAFSP). ICCSA (1) 2007: 767-778

2006

1 EE H. Y. Kang, A. H. I. Lee: Critical dimension control in photolithography based on the yield by a simulation program. Microelectronics Reliability 46(5-6): 1006-1012 (2006)

2007
2	EE	A. H. I. Lee, S. H. Chung, C. Y. Huang: Minimizing the Total Completion Time for the TFT-Array Factory Scheduling Problem (TAFSP). ICCSA (1) 2007: 767-778
2006
1	EE	H. Y. Kang, A. H. I. Lee: Critical dimension control in photolithography based on the yield by a simulation program. Microelectronics Reliability 46(5-6): 1006-1012 (2006)

Coauthor Index

1 S. H. Chung [2]

2 C. Y. Huang [2]

3 H. Y. Kang [1]

Colors in the list of coauthors