H. Y. Kang

List of publications from the DBLP Bibliography Server - FAQ

2006

1 EE H. Y. Kang, A. H. I. Lee: Critical dimension control in photolithography based on the yield by a simulation program. Microelectronics Reliability 46(5-6): 1006-1012 (2006)

2006
1	EE	H. Y. Kang, A. H. I. Lee: Critical dimension control in photolithography based on the yield by a simulation program. Microelectronics Reliability 46(5-6): 1006-1012 (2006)

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