Ulf Lederer
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2001
1
EE
Jörg E. Vollrath
, Ulf Lederer,
Thomas Hladschik
: Compressed Bit Fail Maps for Memory Fail Pattern Classification.
J. Electronic Testing 17
(3-4): 291-297 (2001)
Coauthor
Index
1
Thomas Hladschik
[
1
]
2
Jörg E. Vollrath
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)