S. F. LeBoeuf

2003
1	EE	X. A. Cao, P. M. Sandvik, S. F. LeBoeuf, S. D. Arthur: Defect generation in InGaN/GaN light-emitting diodes under forward and reverse electrical stresses. Microelectronics Reliability 43(12): 1987-1991 (2003)

Coauthor Index

1	S. D. Arthur	[1]
2	X. A. Cao	[1]
3	P. M. Sandvik	[1]