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X. A. Cao

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2003
1EEX. A. Cao, P. M. Sandvik, S. F. LeBoeuf, S. D. Arthur: Defect generation in InGaN/GaN light-emitting diodes under forward and reverse electrical stresses. Microelectronics Reliability 43(12): 1987-1991 (2003)

Coauthor Index

1S. D. Arthur [1]
2S. F. LeBoeuf [1]
3P. M. Sandvik [1]

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