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2003 | ||
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1 | EE | X. A. Cao, P. M. Sandvik, S. F. LeBoeuf, S. D. Arthur: Defect generation in InGaN/GaN light-emitting diodes under forward and reverse electrical stresses. Microelectronics Reliability 43(12): 1987-1991 (2003) |
1 | S. D. Arthur | [1] |
2 | S. F. LeBoeuf | [1] |
3 | P. M. Sandvik | [1] |