| |
| 2002 | ||
|---|---|---|
| 1 | EE | Leon Lantz, Seongdeok Hwang, Michael G. Pecht: Characterization of plastic encapsulant materials as a baseline for quality assessment and reliability testing. Microelectronics Reliability 42(8): 1163-1170 (2002) |
| 1 | Seongdeok Hwang | [1] |
| 2 | Michael G. Pecht | [1] |