Ludovic Le Lan
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1997
1
EE
Marc Perbost
, Ludovic Le Lan,
Christian Landrault
: Automatic Testability Analysis of Boards and MCMs at Chip Level.
Asian Test Symposium 1997
: 36-41
Coauthor
Index
1
Christian Landrault
[
1
]
2
Marc Perbost
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
