V. Labay

2006
1	EE	M. Capobianchi, V. Labay, F. Shi, G. Mizushima: Simulating the Electrical Behavior of Integrated Circuit Devices in the Presence of Thermal Interactions. IEEE Trans. on CAD of Integrated Circuits and Systems 25(10): 2231-2241 (2006)

Coauthor Index

1	M. Capobianchi	[1]
2	G. Mizushima	[1]
3	F. Shi	[1]